A Zeiss Supra40VP variable-pressure field-emission SEM with a PGT energy-dispersive X-ray system and an HKL electron backscattered diffraction system. Resolution of 1 nm is achievable in high-vacuum mode. Additional capabilities include a STEM detector, Peltier-cooled stage (-30°C to +50°C), and a heating stage (+1200°C).

A JEOL JSM-840A scanning electron microscope equipped with an Oxford Instruments energy-dispersive X-ray analyzer for elemental analysis and an Oxford Instruments freezing/heating stage for operation at temperatures in the range -185°C to +200°C.

Output options include secondary electron and backscattered electron images, X-ray point analyses, X-ray element distribution maps, X-ray line profiles, and digital image processing. Gold sputter-coating and carbon-evaporation coating are available for sample preparation.