Zeiss® Supra25 Scanning Electron Microscope (SEM)

The Zeiss® Supra25 SEM features a versatile analytical specimen chamber that can be easily expanded with a choice of optional detectors and a full range of accessories. Utilizing the unique GEMINI® field emission column it delivers superb resolution over the complete high voltage range. The large 5-axes motorized Cartesian stage is particularly useful for handling a number of smaller specimens simultaneously. It is equally useful for accommodating bulky or irregular shaped specimens.

MAIN FEATURES:

• Ultra high resolution over the full high voltage range
• Minimal adjustments required over the full operating voltage range
• High probe current for fast X-ray analysis and mapping
• High efficiency in-lens SE detector for clear surface specific imaging
• Short analytical working distance of 8.5 mm for simultaneous
  high resolution imaging and X-ray analysis
• Easy operation through Windows® XP based SmartSEM™
  control software
• Microsoft Windows® Operating System       
• Smart SEM™ control software    

RELATED INSTRUMENTATION / SOFTWARE:

• Microsoft Windows® Operating System           
• Smart SEM™ control software        

LOCATION/CONTACT INFORMATION

• Direct Write Lab (TDL) SDSM&T         
• James Randle
• james.randle@sdsmt.edu